1 publication

• Published Subscription 22 Jul 2019

  High-k and Low-k Gate Dielectric Stacking for Low Voltage Organic Thin Film Transistors

  By Shagun Pal, Brijesh Kumar

  Abstract: Electrical performance parameters of Organic thin film transistor (OTFT) are closely related to the interface characteristics of gate dielectric and organic semiconductor film. Henceforth, it becomes important to study the effect of gate dielectric stacking on device performance of OTFTs. In this paper, we demonstrate the stacking of high-k and low-k gate dielectric based Single and Dual gate OTFTs. The structural effect of Organic thin film transistors is methodically explored …

  Published in International Journal of Applied Nanotechnology · Vol. 5, Issue 1, 2019 · pp. 1–7 Read article →