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3 articles for “SIF”
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Redundant Keypoint Elimination Using Redundancy Index on Basic SIFT Algorithm
Abstract: ABSTRACT Matching features across different images is a common problem in computer vision. For the images of different scales and rotations, there is the need of scale-invariant feature transform (SIFT). SIFT identifies the distinctive keypoints that are invariant to location, scale, rotation, robust to affine transformations (changes in scale, rotation, shear, and position) and changes in illumination, which are usable for object recognition. SIFT algorithm includes two main stages: feature …
Published in International Journal of Image Processing and Pattern Recognition · Vol. 5, Issue 1, 2019 · pp. 22–31 Read article
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An Optimum Stringer for Straight and Curved Stiffened Panels Using X-FEM Techniques
Abstract: In this study, crack growth, modeling and simulation of various stiffened stringers, unstiffened straight and curved cracked panels are presented using commercially available finite element software package. Computation of stresses and convergence of stress intensity factor for single-edge notch specimens computed using finite element method (FEM) and extended finite element method (X-FEM) and compared with analytical solution. X-FEM techniques like cohesive segment method and linear elastic fracture mechanics, using virtual …
Published in International Journal of Structural Mechanics and Finite Elements · Vol. 4, Issue 2, 2018 · pp. 1–11 Read article
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Improved Approaches of Image Forgery Detection using SURF and 4-level DWT
Abstract: ABSTRACT Today, there are various types of image tampering techniques, and copy-move forgery is one of them in which a piece of the picture is copied and pasted on another part of a picture. The study reviewed the several methods proposed to achieve this goal. This method generally uses both the feature point-based and the block-based algorithm. We use DWT (discrete wavelet transforms) for the decomposition of an image into …
Published in International Journal of Image Processing and Pattern Recognition · Vol. 4, Issue 2, 2018 · pp. 1–8 Read article